Advantest offers solutions for a wide variety of semiconductors and test needs, from SoC and memory, to R&D evaluation and system level test.

ADVANTEST

M6541AD

The M6300 delivers a throughput of up to 12,000 units-per- hour (UPH). Its thermal-control function supports tests within a temperature range of -30 degrees C to +125 degrees C, with an option to extend the lower range to -55 degrees C.

M6300

The M6751A Dynamic Test Handler processes 4500 devices per hour through design breakthroughs that concentrate high-speed handling technologies. The M6751A Dynamic Test Handler processes 4500 devices per hour through design breakthroughs that concentrate high-speed handling technologies. Aimed at the memory device market, including TSOP, SOJ, QFP, BGA, and CSP set-ups, the device provides an advanced memory production system.

M6751A

M6771AD

M6751AD

M6741AD

M6542AD

A pick-and-place hander that handles eight DUTS in parallel for a total throughput of up to 8,000 devices per hour.
The M4871 handler features a variety of capabilities for improving test yields and reducing cycle times. An advanced visual-alignment function enables positioning accuracy of below 0.3 mm ball/pad pitch for handling fine-pitch semiconductors and devices with both top- and bottom-side contacts. This precise alignment capability also helps to speed up set-up and calibration times for greater test-cell productivity.

M4871

M6741A

M 7211

The M4872 features Advantest's Active Thermal Control function, which controls the test temperature with high accuracy even when testing high-end processors and other high-heat-generating devices. Additionally, it inherits the configuration of the M4871, with 10 automatic stockers that enable highly precise device sorting, while delivering a 10% reduction in footprint.

M4872

Advantest's M4541AD dynamic test handler for SoC and other high-end logic devices offered parallel test of up to eight devices, testing up to 6,000 devices per hour.

M4541AD

M7211A

The M6241 can handle up to 512 memory semiconductors simultaneously, including DDR2-SDRAM or DDR3-SDRAM memory semiconductors, and has achieved a maximum throughput of 20,000 semiconductors per hour.

M6241

The M4741A employs the vision alignment system which enables high-accuracy positioning of contact sockets for small-sized/narrow-pitched integrated circuits used in cellular phones and other products. Through the adoption of the vision alignment system, various types of measurement device can be operated under certain conditions without switching the change kit.

M4741A

M6721AD

M6721A

Automated IC handler features remote operation and thermal control to increase the productivity of semiconductor engineering labs.
Today's mobile electronics market consumes large volumes of ICs that require high power dissipation during device characterization and pre-production bring up. To test these devices, IDMs and OSATs need systems capable of cost-efficient thermal control and automated device handling. Advantest's M4171 single-site handler combines these capabilities in a portable design that is ideally suited for use in engineering environments.

M4171

M4742A

The M6242 and M6243 test handlers for test systems for memory semiconductors, including DDR3-SDRAM, can handle up to 512 semiconductors at a time. Their maximum throughput is 42,200 semiconductors per hour through the use of a new high-speed handling technology that shortens the time between tests to approximately half of the time associated with Advantest’s ordinary model. In addition, the M6242 and M6243 have a built-in temperature control device which can minimize the temperature fluctuation within a 1.5°C range for temperatures between -10°C and 100°C. 

M6243

The newest automobiles are required to have good environmental performance and fuel-saving functionality.
Powerful, fuel-saving, low-emissions diesel engines have particulate filters and oxidation catalysts for purifying NOx and soot in their exhaust systems. In order to maintain the performance of these systems, exhaust gas pressure is monitored by differential pressure sensors. The Stimulus Test Cell HA7300 is a test cell which provides an environment for high-speed, highly accurate temperature and pressure test of differential pressure sensors, utilizing Advantest's unique temperature control unit with simultaneous temperature control for 8 devices, as well as a newly developed 2Port pressure controller and pressure application nozzle.

HA7300

M6742A

The M6242 supports memory device package types such as BGA and CSP, and its throughput of 42,200 units per hour is more than double that of the company's previous model, M6241. It offers highly efficient device transfer, thanks to optimization of the complex arm mechanisms that sort good and bad devices after testing. The M6242 enhances productivity and slashes overall cost of test.

M6242

M7521A is a test handler that can be used for chip on film, or COF, and tape automated bonding, or TAB of integrated circuit drivers used in flat-panel displays. The M7521A can test devices used in 34 millimeter, 48 millimeter, 70 millimeter, wide and superwide tapes.

M7521A

M4642A

M6771A

M6742AD

Unique in its class, Advantest's M4841 Test Handler enables high-throughput parallel test for very high volumes of devices and supports complex ICs and packages, including BGA, CSP and QFP. Because of its advanced performance capabilities and features, the M4841 is the optimal test handler for high volume production of devices used in consumer products such as portable digital equipment and automotive systems.

M4841

Advanced automobiles are required to have improved environmental and safety performance, and are also expected to be connected to the IoT through connected car and autonomous car technology.
The HA7200 enables these improvements by providing high-speed, high-accuracy temperature and pressure test for automotive sensor R&D and production. Advantest's proprietary temperature control technology delivers an optimized test solution for high-spec pressure sensors across a broad range of temperatures, in the automotive industry and beyond. Combined with a test handler and Advantest's EVA100 measurement system, the HA7200 anchors a sensor test cell system that provides an easy-to-use test environment covering all stages of product development, from design evaluation to mass production.

HA7200

M4632A

The M6541A Dynamic Test Handler is designed with a proprietary four-step handling function that keeps index time to a minimum, the M6541A can handle simultaneous testing of up to 64 devices — 6,000 devices per hour. The M6541A's touch panel and comprehensive help function make it extremely easy to operate. In addition, the system was designed so that the time needed for establishing operating requirements and correcting problems are significantly reduced.

M6541A

The M4541A Dynamic Test Handler is capable of simultaneously testing up to four logic devices, including MCUs, ASICs, and SOCs. This new handler possesses a maximum throughput of 6,000 devices per hour, roughly twice that of its predecessors. The handler's efficient structural layout provides a smaller footprint while helping to reduce testing costs.

M4541A

Using a precision visual-alignment system, the M6245 handler can achieve contact accuracy to within 0.3 mm ball pitch. In addition to improving test yields, this enables faster set-up and calibration for maximum throughput.

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M6541AD

21 掲載リスト

M6300

16 掲載リスト

M6751A

9 掲載リスト

M6771AD

9 掲載リスト

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