HORIBA

PR-PD2

UT-300

The Auto SE is a new thin film measurement tool that allows full automatic analysis of thin film samples with simple push button operation.

Sample analysis takes only a few seconds and provides a complete report that fully describes the thin film stack – including film thicknesses, optical constants, surface roughness, and film inhomogeneities.

The Auto SE is a highly featured instrument that includes an automatic XYZ stage, real-time imaging of the measurement site and automatic selection of spot size. Many accessories are available to suit a large range of applications.

The Auto SE includes built-in diagnostic indicators for the automatic detection and diagnosis of problems, with comprehensive operator guidance for troubleshooting.

The Auto SE stands out in its ease of use and numerous automatic features that made the Auto SE a turnkey instrument ideal for routine thin film measurement and device quality control.

Auto SE

The iHR series is built on decades of experience in spectroscopy and represents the highest quality, performance and versatility of any spectrometers in this class. The iHR 320 and iHR 550 spectrometers are immediately recognizable around the world by their unique shape, the result of a superior optical design. These spectrometers benefit from the highest quality of gratings, also designed and manufactured by HORIBA. The iHR series is ideal for applications such as:

-Raman
-Fluorescence
-Photoluminescecne
-Absorbance / Transmission / Reflectance / Emission Analysis
 

iHR 320

UVISEL 2 

EX-250

OPGU-2200

The UVISEL Spectroscopic Phase Modulated Ellipsometer is a unique instrument that delivers the highest accuracy and precision for demanding research and industrial QC applications. It covers a wide spectral range from 190 to 2100 nm, with a complete application database included in the software.

UVISEL

The LA-950V2 combines the advanced optical system and sampling systems Into a single high-speed system that optimizes all of these steps. The LA-950V2 uses an innovative optical system to obtain the world's widest dynamic range of 10 nm – 3000 μm. This makes it possible to perform precise particle size measurements on a wide scale in many different industries. From ultra-fine nano-order particles to individually visible particles, all can be measured with this single instrument. Designed to handle the entire range of applications extending from the complex needs of research to routine quality control procedures, the LA-950V2 offers practicality as a “standard instrument” that is easy to use and enables precise measurement

LA-950V2

TRIAX 550

XGT-5000

GD-Profiler 2

PD3000

The Horiba Jobin Yvon LabRAM HR system provides ultra high spectroscopic resolution and a unique wavelength range capability that provides both great flexibility and high performance.

HR800

Activa-M

XGT-1700WR

EMIA-811W

The Partica LA-950 Laser Diffraction Particle Size Distribution Analyzer is the highest performance particle sizing instrument on the market. It out performs every other particle size analyzer in every facet: measurement range, speed, precision, ease of use, and software features. A range of accessories allow the user to configure the system for maximum flexibility and performance, optimized for each application.

LA-950

PR-PD3

PR-PD35

PD10

FHR 1000

XploRA PLUS

23201010 H

LA-960

T64000

ABX PENTRA XL 80

ABX MICROS 60

***PARTS***

Dynamic Light-Scattering Particle Size Analyzer

LB-500

ENDA-7000

LA-300

LabRAM HR Evolution

CS-100

LF-30M-A-EVD1

The ULTIMA 2C HR is the top-of-the-line in ICP OES instrumentation and offers the performance necessary to achieve accurate results in even the most complex materials,
such as zirconium and tungsten, precious metals or applications featuring rare earth elements in trace concentrations. 

ULTIMA 2C HR

PR-PD2HR

PR-PD1

MacroRAM

Harmful Element Fluorescence X-ray Inspection Instrument

XGT-1000WR

X-ray Energy Dispersive Spectroscopy (EDX) Model:EMAX Energy X-Act

EMAX x-stream2

The LabRAM ARAMIS can provide unequalled depth discrimination, identifying and characterising thin films and layers sometimes hundreds of microns beneath the surface of a sample.

HORIBA

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