A semi-automated recovery system designed to collect nano metal contamination on the surfaces of silicon wafers.

NAS GIKEN

SC-3100

A semi-automated recovery system designed to collect nano-level metal contamination on the surfaces and bevels of silicon wafers.

SC-9100

A semi-automated recovery system designed to collect trace nano-level metallic contaminants from the front and side surfaces of silicon wafers and compound semiconductor wafers. It ensures high analytical precision while minimizing the risk of human contamination.

SC-9200

A specialized semiconductor manufacturing and analytical preparation device.

NAS GIKEN

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SC-3100

SC-9100

SC-9200

VPDBOX-300-5M

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