TOHO TECHNOLOGY

FLX 2320

FLX 3300R

Toho FLX-2320-S Thin Film Stress Measurement Systems offer industry standard capabilities for mass production and research facilities that demand accurate stress measurements on various films and substrates up to 200mm in diameter. Incorporating KLA-Tencor’s patented “Dual Wavelength” technology, Toho FLX Series tools determine and analyze surface stress caused by deposited thin films. The Toho FLX systems offer outstanding value in a variety of comprehensive Stress Measurement Solutions that utilize advanced measurement principles. 

TOHO TECHNOLOGY

概要（Overview）

現在の掲載品

全ての製品

サービス

トップ製品

FLX 2320

FLX 3300R

FLX 2320-S

Moovに掲載品して、すぐに申し分ない購入者を見つけましょう。

全ての製品

全ての掲載品を見る