VERASEM 3D
カテゴリ
CD-SEM概要（Overview）
The AMAT VeraSEM 3D is an advanced semiconductor imaging system introduced by Applied Materials. It offers three-dimensional imaging capabilities for chip features as small as 0.10 micron, allowing users to gain valuable insights into semiconductor structures with high precision. The system's enhanced efficiency makes it a powerful tool for semiconductor analysis and research.
現在の掲載品
14
サービス
検査、保証、鑑定、ロジスティクス
