Applied Materials is committed to accelerating this new PPACt playbook for our customers and partners. We have the broadest and deepest portfolio of products for delivering PPACt innovations to the market. This portfolio encompasses the ability to create and deposit, shape and remove, modify, analyze, and connect materials and devices in new ways. We are unique in having a broad suite of process technology and metrology capabilities under one roof, and we have highly differentiated silicon and packaging lab capabilities. Our Integrated Materials Solutions co-optimize materials deposition, removal, modification, and analysis to create new materials and engineer new structures for high-performance, low-power chips at leading-edge nodes.

APPLIED MATERIALS (AMAT)

The AMAT SEMVision G2 is a high-throughput, fully automatic Defect Analysis system developed by Applied Materials (AMAT). It is designed to be seamlessly integrated into production lines, allowing customers to analyze defects with exceptional productivity. The system is capable of detecting and analyzing defects as small as 50nm, providing crucial insights into the quality and performance of semiconductor devices during manufacturing.

SEMVISION G2

9DEBD585-7907-4824-B1AB-4C566146F29E_1_201_a.jpeg

65094355-42CB-4D8F-9F0D-DA86E267A2DC.jpeg

APPLIED MATERIALS (AMAT)

SEMVISION G2

Defect Inspection

同様のリスト

APPLIED MATERIALS (AMAT)

SEMVISION G2

APPLIED MATERIALS (AMAT)

SEMVISION G2

APPLIED MATERIALS (AMAT)

SEMVISION G2

APPLIED MATERIALS (AMAT)

SEMVISION G2

SEMVISION G2

Defect Inspection

同様のリスト

APPLIED MATERIALS (AMAT)

SEMVISION G2

APPLIED MATERIALS (AMAT)

SEMVISION G2

APPLIED MATERIALS (AMAT)

SEMVISION G2

APPLIED MATERIALS (AMAT)

SEMVISION G2