説明
Applied Materials SEMVision STAR Defect Analysis, Scanning Electron Microscope構成
Inspection LD: 2ea, AsystInspection SEMOEMモデルの説明
The AMAT SEMVision G2 is a high-throughput, fully automatic Defect Analysis system developed by Applied Materials (AMAT). It is designed to be seamlessly integrated into production lines, allowing customers to analyze defects with exceptional productivity. The system is capable of detecting and analyzing defects as small as 50nm, providing crucial insights into the quality and performance of semiconductor devices during manufacturing.ドキュメント
ドキュメントなし
APPLIED MATERIALS (AMAT)
SEMVISION G2
検証済み
カテゴリ
Defect Inspection
主なアイテムの詳細
状態：
Used
稼働ステータス:
Installed / Running
製品ID：
93121
ウェーハサイズ：
不明
ヴィンテージ：
2002
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示同様のリストが見つかりません
APPLIED MATERIALS (AMAT)
SEMVISION G2
検証済み
カテゴリ
Defect Inspection
最終検証： 7日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
Installed / Running
製品ID：
93121
ウェーハサイズ：
不明
ヴィンテージ：
2002
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Applied Materials SEMVision STAR Defect Analysis, Scanning Electron Microscope構成
Inspection LD: 2ea, AsystInspection SEMOEMモデルの説明
The AMAT SEMVision G2 is a high-throughput, fully automatic Defect Analysis system developed by Applied Materials (AMAT). It is designed to be seamlessly integrated into production lines, allowing customers to analyze defects with exceptional productivity. The system is capable of detecting and analyzing defects as small as 50nm, providing crucial insights into the quality and performance of semiconductor devices during manufacturing.ドキュメント
ドキュメントなし
同様のリスト
すべて表示同様のリストが見つかりません