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UVISION

カテゴリ
Defect Inspection
概要(Overview)

Applied UVisiontm Inspection system, a laser-based 3D brightfield tool. Utilizing multi-beam DUV laser illumination and high efficiency detectors, the UVision system uncovers critical defects on the wafer that have not been detected before by any other system, enabling customers to rapidly resolve performance-limiting defect issues and achieve greater chip yields.

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