SEMVision™ is a powerful tool designed to be fully integrated into the defect reduction cycle for advanced production lines. It delivers high throughput and automated defect review using high-resolution scanning electron microscope (SEM) technology and imaging. This means that it can quickly and accurately identify and analyze defects in the production process, helping to improve the overall quality and efficiency of the production line.

Applied Materials is committed to accelerating this new PPACt playbook for our customers and partners. We have the broadest and deepest portfolio of products for delivering PPACt innovations to the market. This portfolio encompasses the ability to create and deposit, shape and remove, modify, analyze, and connect materials and devices in new ways. We are unique in having a broad suite of process technology and metrology capabilities under one roof, and we have highly differentiated silicon and packaging lab capabilities. Our Integrated Materials Solutions co-optimize materials deposition, removal, modification, and analysis to create new materials and engineer new structures for high-performance, low-power chips at leading-edge nodes.

SEMVision

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