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説明
Parts/Options構成
構成なしOEMモデルの説明
The SEMVision cX is designed for the automatic review and classification of wafer defects in advanced semiconductor production lines. It builds on the company’s SEMVision system and features automatic material identification that characterizes defects on unpatterned wafers and provides chipmakers with information on the defect’s source. The system also offers high-productivity operation at 500 defects per hour and color MPSI (Multiple Perspective SEM Imaging) for enhanced topography and material information. The SEMVision cX is the first SEM review system to feature OperatorFree EDX (energy dispersive x-ray) analysis that increases processing speed of the system and requires less engineering expertise. For the first time, material information is combined with automated defect classification (ADC) to provide fab engineers with all vital defect data.ドキュメント
ドキュメントなし
カテゴリ
Defect Inspection
最終検証： 30日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
119572
ウェーハサイズ：
8"/200mm
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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すべて表示
APPLIED MATERIALS (AMAT)
SEMVision cX
カテゴリ
Defect Inspection
最終検証： 30日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
119572
ウェーハサイズ：
8"/200mm
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Parts/Options構成
構成なしOEMモデルの説明
The SEMVision cX is designed for the automatic review and classification of wafer defects in advanced semiconductor production lines. It builds on the company’s SEMVision system and features automatic material identification that characterizes defects on unpatterned wafers and provides chipmakers with information on the defect’s source. The system also offers high-productivity operation at 500 defects per hour and color MPSI (Multiple Perspective SEM Imaging) for enhanced topography and material information. The SEMVision cX is the first SEM review system to feature OperatorFree EDX (energy dispersive x-ray) analysis that increases processing speed of the system and requires less engineering expertise. For the first time, material information is combined with automated defect classification (ADC) to provide fab engineers with all vital defect data.ドキュメント
ドキュメントなし