WF-736
概要(Overview)
Using laser-based technology, Applied Materials’ WF-736 system detects defects on patterned wafers (wafers with circuit images printed on them) as they move between processing steps. Defects may include particles, open circuit lines, shorts between lines or other problems.
現在の掲載品
0
サービス
検査、保証、鑑定、ロジスティクス