説明
FEI Company Expida 1285 (DA300)構成
-NG SEM Electron Column -Sidewinder Column -300 mm Stage -ETD/TLD/CDEM Detector -Omniprobe -PT GIS -Cap Probe -300 MM loaderOEMモデルの説明
The FEI Expida 1285 offers the ultimate in defect characterization, failure analysis and TEM sample preparation on patterned and unpatterned wafers. With fast and accurate 3D defect characterization, you get increased control and improved yield. The Expida 1285 includes an integrated front-end module designed to simultaneously handle 200mm and 300mm wafers using load port modules in addition to all of the performance specification of the Expida 1255S.ドキュメント
ドキュメントなし
カテゴリ
Defect Inspection
最終検証： 2日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
137369
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
THERMOFISHER SCIENTIFIC / FEI / PHILIPS
EXPIDA 1285
カテゴリ
Defect Inspection
最終検証： 2日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
137369
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
FEI Company Expida 1285 (DA300)構成
-NG SEM Electron Column -Sidewinder Column -300 mm Stage -ETD/TLD/CDEM Detector -Omniprobe -PT GIS -Cap Probe -300 MM loaderOEMモデルの説明
The FEI Expida 1285 offers the ultimate in defect characterization, failure analysis and TEM sample preparation on patterned and unpatterned wafers. With fast and accurate 3D defect characterization, you get increased control and improved yield. The Expida 1285 includes an integrated front-end module designed to simultaneously handle 200mm and 300mm wafers using load port modules in addition to all of the performance specification of the Expida 1255S.ドキュメント
ドキュメントなし