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市場 > Defect Inspection > NIKON > OPTISTATION 7

OPTISTATION 7

カテゴリ
Defect Inspection
概要(Overview)

The Optistation 7 IC Wafer Inspection System Dual, a 300mm fabrication compliant unit featuring a feeder arm transfer unit offering high throughput with a new macro illumination system allowing for thin film observation and defocus detection as well as detection of particulates and scratches on both front and backside.

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