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市場 > Defect Inspection > NIKON > OPTISTATION V

OPTISTATION V

カテゴリ
Defect Inspection
概要(Overview)

The Optistation V, a cost-effective inspection unit featuring a small footprint and a full range of optical techniques. Accommodates Bright Field, Dark Field, Nomarski DIC as well as Confocal observation all on one system. The high precision wafer alignment and DART defect review packages offer review capabilities for virtually all file formats.

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