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KEYSIGHT / AGILENT / HEWLETT-PACKARD (HP) 4073A
    説明
    Parametric Tester
    構成
    構成なし
    OEMモデルの説明
    The Agilent 4073A ultra advanced parametric tester with Agilent SPECS is designed to perform highly precise DC measurement, capacitance measurement, flash memory cell testing, and testing of other high-frequency applications. The system supports up to eight source monitor units (SMUs), two of which may be high-resolution SMUs (HRSMUs), and two of which may be high-power SMUs (HPSMUs). Each SMU is self-calibrating and may be individually configured to force either current or voltage and simultaneously measure either voltage or current.
    ドキュメント

    ドキュメントなし

    KEYSIGHT / AGILENT / HEWLETT-PACKARD (HP)

    4073A

    verified-listing-icon

    検証済み

    カテゴリ
    Final Test

    最終検証: 14日前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    113722


    ウェーハサイズ:

    12"/300mm


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    KEYSIGHT / AGILENT / HEWLETT-PACKARD (HP) 4073A

    KEYSIGHT / AGILENT / HEWLETT-PACKARD (HP)

    4073A

    Final Test
    ヴィンテージ: 2001状態: 中古
    最終確認60日以上前

    KEYSIGHT / AGILENT / HEWLETT-PACKARD (HP)

    4073A

    verified-listing-icon
    検証済み
    カテゴリ
    Final Test
    最終検証: 14日前
    listing-photo-510f091313ac4a9198e394638c3051b0-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    113722


    ウェーハサイズ:

    12"/300mm


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    Parametric Tester
    構成
    構成なし
    OEMモデルの説明
    The Agilent 4073A ultra advanced parametric tester with Agilent SPECS is designed to perform highly precise DC measurement, capacitance measurement, flash memory cell testing, and testing of other high-frequency applications. The system supports up to eight source monitor units (SMUs), two of which may be high-resolution SMUs (HRSMUs), and two of which may be high-power SMUs (HPSMUs). Each SMU is self-calibrating and may be individually configured to force either current or voltage and simultaneously measure either voltage or current.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    KEYSIGHT / AGILENT / HEWLETT-PACKARD (HP) 4073A

    KEYSIGHT / AGILENT / HEWLETT-PACKARD (HP)

    4073A

    Final Testヴィンテージ: 2001状態: 中古最終検証:60日以上前
    KEYSIGHT / AGILENT / HEWLETT-PACKARD (HP) 4073A

    KEYSIGHT / AGILENT / HEWLETT-PACKARD (HP)

    4073A

    Final Testヴィンテージ: 2000状態: 中古最終検証:60日以上前
    KEYSIGHT / AGILENT / HEWLETT-PACKARD (HP) 4073A

    KEYSIGHT / AGILENT / HEWLETT-PACKARD (HP)

    4073A

    Final Testヴィンテージ: 0状態: 中古最終検証:14日前