概要（Overview）

Synchro test systems are designed for high throughput testing of linear devices and for testing of mixed signal devices that require high digital pattern rates and high digital pin counts. The Synchro features independent microprocessors that concurrently control both linear and digital resources at each pin of the IC under test. This design permits the generation of test signals and measurements on many device pins at the same time, producing faster test times on high pin count ICs.