概要（Overview）

The L210 VLSI board test system for applications including multi-mode testing and performance functional testing. The multimode strategy employs performance in-circuit tests exercise devices at rates up to 10 MHz to find data domain errors and timing faults below 100 ns. Bus cycle emulation tests functionally exercise logic and memory clusters. Board-level functional tests typically use an on-board self-test or operational code downloaded into board memory.