We value your privacy
We and our selected partners use cookies to enhance your browsing experience, serve personalized content, and analyze our traffic. By clicking "Accept All", you consent to our use of cookies. 続きを読む
LTA-1200
概要（Overview）
This product is effective in evaluating contamination and defects in ultra-thin SOI / epi / bulk wafers and polysilicon layers. Lifetime is an important parameter that sensitively reflects contamination and crystal defects mixed in the sample.
現在の掲載品
0
サービス
検査、保証、鑑定、ロジスティクス
トップ掲載リスト
- 製品が見つかりません