説明
説明なし構成
COCOS, SILC & EPI-t Test Capabilities For Analyzing 200mm & 300mm Wafers 300mm (dia.) Anodized Aluminum Hot Chuck 300mm (dia.) Gold Plated Measurement Chuck PRI ATM 407-1-S Wafer Handling Robot PRI ESC-212B Robot Controller EQUIPE TECHNOLOGIES PRE -4281 Wafer Prealigner 2ea NEWPORT RESEARCH MM3000 Motion Controllers 2ea SDI PDM-40a Control Boxes SDI Temperature Control Box SDI Corona Switch Box SDI I/O Control Box SDI Opto Coupler SDI BNC Switch Box SDI 12V/24V Power Supply SDI Height Sensor Control Box SDI Vacuum/Pneumatic Control Box WAVETEK Model 29 10 MHz DDS Function Generator 2ea BERTRAN 2341-1 High Voltage Power Supplies EG&G 7265 DSP Lock-In Amplifier HEWLETT PACKARD Vectra VE6/450 Computer 3.5” Floppy Disc Drive 100GB Jazz Drive MITSUBISHI LXA550W LCD Monitor OMEGA HX92 Humidity Sensor/Transmitter ADE 3800 Probe Sensor Control BoxOEMモデルの説明
The SEMILAB FAaST 330 is an electrical metrology system that uses non-contact methods to measure the properties of materials. It combines two patented techniques, known as Micro and Macro corona-Kelvin methods, into one platform. This system is designed to support both advanced research and development and high-volume manufacturing environments. The FAaST 330/230 DSPV systems provide fast, non-contact monitoring of heavy metal contamination in wafers, with the ability to detect even very low levels of contamination. The FAaST 330/230 C-V / I-V systems use advanced measurement techniques to provide non-contact imaging of dielectric and interface properties on monitor wafers. These systems include automated wafer handling and are suitable for medium to high-volume manufacturing environments.ドキュメント
ドキュメントなし
SEMILAB
FAAST 330
検証済み
カテゴリ
Metrology
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
24311
ウェーハサイズ：
12"/300mm
ヴィンテージ：
1999
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
SEMILAB
FAAST 330
検証済み
カテゴリ
Metrology
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
24311
ウェーハサイズ：
12"/300mm
ヴィンテージ：
1999
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
説明なし構成
COCOS, SILC & EPI-t Test Capabilities For Analyzing 200mm & 300mm Wafers 300mm (dia.) Anodized Aluminum Hot Chuck 300mm (dia.) Gold Plated Measurement Chuck PRI ATM 407-1-S Wafer Handling Robot PRI ESC-212B Robot Controller EQUIPE TECHNOLOGIES PRE -4281 Wafer Prealigner 2ea NEWPORT RESEARCH MM3000 Motion Controllers 2ea SDI PDM-40a Control Boxes SDI Temperature Control Box SDI Corona Switch Box SDI I/O Control Box SDI Opto Coupler SDI BNC Switch Box SDI 12V/24V Power Supply SDI Height Sensor Control Box SDI Vacuum/Pneumatic Control Box WAVETEK Model 29 10 MHz DDS Function Generator 2ea BERTRAN 2341-1 High Voltage Power Supplies EG&G 7265 DSP Lock-In Amplifier HEWLETT PACKARD Vectra VE6/450 Computer 3.5” Floppy Disc Drive 100GB Jazz Drive MITSUBISHI LXA550W LCD Monitor OMEGA HX92 Humidity Sensor/Transmitter ADE 3800 Probe Sensor Control BoxOEMモデルの説明
The SEMILAB FAaST 330 is an electrical metrology system that uses non-contact methods to measure the properties of materials. It combines two patented techniques, known as Micro and Macro corona-Kelvin methods, into one platform. This system is designed to support both advanced research and development and high-volume manufacturing environments. The FAaST 330/230 DSPV systems provide fast, non-contact monitoring of heavy metal contamination in wafers, with the ability to detect even very low levels of contamination. The FAaST 330/230 C-V / I-V systems use advanced measurement techniques to provide non-contact imaging of dielectric and interface properties on monitor wafers. These systems include automated wafer handling and are suitable for medium to high-volume manufacturing environments.ドキュメント
ドキュメントなし