説明
説明なし構成
Particle Measuring SAS 5800 Surface Analysis Particle Measuring System. Sizes and locates surface contamination and defects down to 0.10 micro-meters (PSL reference) in a fully automated 100mm - 200mm, cassette to cassette operation. The SAS 5800 includes teo polarized HE-NE Lasers which provide independent S and P polarization analysis. The contamination and defects are assigned as point, line and area defects. Accept/reject criteria is based on particle, scratch, area defect and STS (surface roughness). Sold As Is.OEMモデルの説明
提供なしドキュメント
ドキュメントなし
PARTICLE MEASURING SYSTEMS (PMS)
LASAIR 110
検証済み
カテゴリ
Laser
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
14356
ウェーハサイズ：
不明
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
PARTICLE MEASURING SYSTEMS (PMS)
LASAIR 110
検証済み
カテゴリ
Laser
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
14356
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
説明なし構成
Particle Measuring SAS 5800 Surface Analysis Particle Measuring System. Sizes and locates surface contamination and defects down to 0.10 micro-meters (PSL reference) in a fully automated 100mm - 200mm, cassette to cassette operation. The SAS 5800 includes teo polarized HE-NE Lasers which provide independent S and P polarization analysis. The contamination and defects are assigned as point, line and area defects. Accept/reject criteria is based on particle, scratch, area defect and STS (surface roughness). Sold As Is.OEMモデルの説明
提供なしドキュメント
ドキュメントなし