FSM-128L
カテゴリ
Metrology概要（Overview）
Film stress and wafer bow measurement for wafers up to 300mm diameter. 2D/3D stress mapping standard. Semi-automated system with convenient wafer loading and retrieval.
現在の掲載品
1
サービス
検査、保証、鑑定、ロジスティクス
Film stress and wafer bow measurement for wafers up to 300mm diameter. 2D/3D stress mapping standard. Semi-automated system with convenient wafer loading and retrieval.
1
検査、保証、鑑定、ロジスティクス
