RAMAN 360
カテゴリ
Metrology概要（Overview）
Micro Raman system for lattice level strain and material composition measurement. High spectral resolution (0.02 cm-1) and sub micron lateral resolution. Measurement of through silicon via (TSV) keep out zone, local stress and composition profiling. Fully automated C2C system.
現在の掲載品
1
サービス
検査、保証、鑑定、ロジスティクス
