MAC-R
カテゴリ
Metrology概要（Overview）
MAC-R is the go-to overlay metrology system for production of power devices and legacy semiconductors. It provides excellent performance for a low price compared with similar systems. Wafer sizes: 3-inch, 4-inch, 5-inch, 6-inch, 8-inch Proven in mass production lines
現在の掲載品
1
サービス
検査、保証、鑑定、ロジスティクス
