説明
説明なし構成
Veeco Bruker Wyko SP9900 Large Format Optical Surface Profiler. Automated non-contact 3D critical dimension measurements. Large format surface profiling system delivers unmatched measurement performance on substrate panels, bumped substrates, flat panels and circuit boards for improved process monitoring and increased yields. High resolution imaging and patented vertical scanning interferometry system can perform accurate 3D critical dimension measurements with nanometer resolution. Powerful surface metrology instrument and defect inspection tool. Measurement Capability: Non-contact, three dimensional, surface, critical dimension, film thickness, tribology. Vertical Measurement Range: 0.1nm to 10mm. Vertical Resolution: Less than 0.1nm. RMS Repeatability: 0.01nm. No Cognex system. 115/230V, 1 Ph, 50/60 Hz, CE. Mfg.: 2008.OEMモデルの説明
提供なしドキュメント
ドキュメントなし
WYKO / VEECO
SP 3200
検証済み
カテゴリ
Profiler
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
21924
ウェーハサイズ：
不明
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
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WYKO / VEECO
SP 3200
検証済み
カテゴリ
Profiler
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
21924
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
説明なし構成
Veeco Bruker Wyko SP9900 Large Format Optical Surface Profiler. Automated non-contact 3D critical dimension measurements. Large format surface profiling system delivers unmatched measurement performance on substrate panels, bumped substrates, flat panels and circuit boards for improved process monitoring and increased yields. High resolution imaging and patented vertical scanning interferometry system can perform accurate 3D critical dimension measurements with nanometer resolution. Powerful surface metrology instrument and defect inspection tool. Measurement Capability: Non-contact, three dimensional, surface, critical dimension, film thickness, tribology. Vertical Measurement Range: 0.1nm to 10mm. Vertical Resolution: Less than 0.1nm. RMS Repeatability: 0.01nm. No Cognex system. 115/230V, 1 Ph, 50/60 Hz, CE. Mfg.: 2008.OEMモデルの説明
提供なしドキュメント
ドキュメントなし
同様のリスト
すべて表示同様のリストが見つかりません