ZYGO

GPI XP

MARK GPI-XPS 

The UniFire 7900 optical metrology system provides high precision, three-dimensional topography information to control high volume manufacturing processes. The UniFire 7900 is used for surface topography, critical dimensions, overlay/registration, and film thickness process control all within a small footprint.

UNIFIRE 7900

The Verifire™ Laser Interferometer is a metrology system that provides fast and reliable measurements of surface form error, and transmitted wavefront of optical components, systems, and assemblies. The Verifire™ interferometer system is a true laser Fizeau design that expands upon ZYGO’s unmatched experience in surface form metrology. The system uses a ZYGO-manufactured HeNe laser source combined with ZYGO’s patented acquisition algorithms and full-featured Mx™ metrology software to enable high-precision metrology with easy-to-use analysis capabilities. This makes the Verifire™ Laser Interferometer an essential tool for any optics shop looking to achieve the highest levels of precision and accuracy in their measurements.

VERIFIRE

GPI LC

MARK III-01

The Zygo Mark II Interferometer System* is designed for measurement problems requiring high precision, noncontact, nondestructive evaluation of specular plano or spherical surfaces in reflection, or components or systems in transmission. The key modules in the Interferometer System consist of the Mark II Mainframe and the Video Monitor. An optional Model VP-2 Video Printer may also be added to provide hard-copy output. Each of the system modules is described in detail in this section.

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トップZYGO Metrology

GPI XP

MARK GPI-XPS

UNIFIRE 7900

VERIFIRE

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すべてのZYGO Metrology