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VEECO DIMENSION 5000
  • VEECO DIMENSION 5000
  • VEECO DIMENSION 5000
  • VEECO DIMENSION 5000
説明
No missing parts
構成
構成なし
OEMモデルの説明
The Dimension 5000 Scanning Probe Microscope (SPM) is an advanced tool designed for semiconductor and data storage device manufacturers. It is capable of measuring up to one hundred areas on samples as large as 350 mm in diameter. The Dimension 5000 SPM is equipped with a wide range of atomic force microscopy (AFM) and scanning tunneling microscopy (STM) techniques, allowing it to detect faults, measure roughness, and analyze other features in three dimensions. One of the key advantages of the Dimension 5000 SPM is that it can perform these measurements without destroying, pretreating, or modifying the sample. This makes it an ideal tool for manufacturers who need to quickly and accurately analyze their products.
ドキュメント

ドキュメントなし

カテゴリ
Microscope

最終検証: 60日以上前

主なアイテムの詳細

状態:

Used


稼働ステータス:

Installed / Running


製品ID:

101130


ウェーハサイズ:

不明


ヴィンテージ:

不明


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

VEECO

DIMENSION 5000

verified-listing-icon
検証済み
カテゴリ
Microscope
最終検証: 60日以上前
listing-photo-71d8dd9d8b224cb4918016c55a01c9a8-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/71d8dd9d8b224cb4918016c55a01c9a8/ad83d40e55c646179b2b7ee9c00d2396_00517dbc457d4e7eb9580eb1ffb0c5431201a_mw.jpeg
listing-photo-71d8dd9d8b224cb4918016c55a01c9a8-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/71d8dd9d8b224cb4918016c55a01c9a8/015631599d754a1c8756769bbe9dcc89_cc2e8761e41d40fa98a864fa4bc406961201a_mw.jpeg
listing-photo-71d8dd9d8b224cb4918016c55a01c9a8-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/71d8dd9d8b224cb4918016c55a01c9a8/f4ff31ef369d418bbb713d32df021062_0ac358c7bb944955a54d53b0b9cf92e21201a_mw.jpeg
主なアイテムの詳細

状態:

Used


稼働ステータス:

Installed / Running


製品ID:

101130


ウェーハサイズ:

不明


ヴィンテージ:

不明


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
No missing parts
構成
構成なし
OEMモデルの説明
The Dimension 5000 Scanning Probe Microscope (SPM) is an advanced tool designed for semiconductor and data storage device manufacturers. It is capable of measuring up to one hundred areas on samples as large as 350 mm in diameter. The Dimension 5000 SPM is equipped with a wide range of atomic force microscopy (AFM) and scanning tunneling microscopy (STM) techniques, allowing it to detect faults, measure roughness, and analyze other features in three dimensions. One of the key advantages of the Dimension 5000 SPM is that it can perform these measurements without destroying, pretreating, or modifying the sample. This makes it an ideal tool for manufacturers who need to quickly and accurately analyze their products.
ドキュメント

ドキュメントなし