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VEECO DIMENSION 5000
    説明
    No missing parts
    構成
    構成なし
    OEMモデルの説明
    The Dimension 5000 Scanning Probe Microscope (SPM) is an advanced tool designed for semiconductor and data storage device manufacturers. It is capable of measuring up to one hundred areas on samples as large as 350 mm in diameter. The Dimension 5000 SPM is equipped with a wide range of atomic force microscopy (AFM) and scanning tunneling microscopy (STM) techniques, allowing it to detect faults, measure roughness, and analyze other features in three dimensions. One of the key advantages of the Dimension 5000 SPM is that it can perform these measurements without destroying, pretreating, or modifying the sample. This makes it an ideal tool for manufacturers who need to quickly and accurately analyze their products.
    ドキュメント

    ドキュメントなし

    VEECO

    DIMENSION 5000

    verified-listing-icon

    検証済み

    カテゴリ
    Microscope

    最終検証: 60日以上前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    Installed / Running


    製品ID:

    101130


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    VEECO DIMENSION 5000

    VEECO

    DIMENSION 5000

    Microscope
    ヴィンテージ: 0状態: 中古
    最終確認60日以上前

    VEECO

    DIMENSION 5000

    verified-listing-icon
    検証済み
    カテゴリ
    Microscope
    最終検証: 60日以上前
    listing-photo-71d8dd9d8b224cb4918016c55a01c9a8-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/71d8dd9d8b224cb4918016c55a01c9a8/ad83d40e55c646179b2b7ee9c00d2396_00517dbc457d4e7eb9580eb1ffb0c5431201a_mw.jpeg
    listing-photo-71d8dd9d8b224cb4918016c55a01c9a8-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/71d8dd9d8b224cb4918016c55a01c9a8/015631599d754a1c8756769bbe9dcc89_cc2e8761e41d40fa98a864fa4bc406961201a_mw.jpeg
    listing-photo-71d8dd9d8b224cb4918016c55a01c9a8-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/71d8dd9d8b224cb4918016c55a01c9a8/f4ff31ef369d418bbb713d32df021062_0ac358c7bb944955a54d53b0b9cf92e21201a_mw.jpeg
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    Installed / Running


    製品ID:

    101130


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    No missing parts
    構成
    構成なし
    OEMモデルの説明
    The Dimension 5000 Scanning Probe Microscope (SPM) is an advanced tool designed for semiconductor and data storage device manufacturers. It is capable of measuring up to one hundred areas on samples as large as 350 mm in diameter. The Dimension 5000 SPM is equipped with a wide range of atomic force microscopy (AFM) and scanning tunneling microscopy (STM) techniques, allowing it to detect faults, measure roughness, and analyze other features in three dimensions. One of the key advantages of the Dimension 5000 SPM is that it can perform these measurements without destroying, pretreating, or modifying the sample. This makes it an ideal tool for manufacturers who need to quickly and accurately analyze their products.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    VEECO DIMENSION 5000

    VEECO

    DIMENSION 5000

    Microscopeヴィンテージ: 0状態: 中古最終検証:60日以上前