メインコンテンツにスキップ
We value your privacy

We and our selected partners use cookies to enhance your browsing experience, serve personalized content, and analyze our traffic. By clicking "Accept All", you consent to our use of cookies. 続きを読む

Moov logo

Moov Icon
市場 > Overlay > ASML > YieldStar 350E

YieldStar 350E

カテゴリ
Overlay
概要(Overview)

The YieldStar 350E’s capabilities stem from key innovations such as a new, dedicated sensor for overlay measurements. In addition, improvements to how the light used in the diffraction-based measurements is both delivered and collected allows the new system to carry out multiple measurements at the same time. By increasing the number of sampling points, the YieldStar 350E actually helps reduce the amount manufacturers need to invest in metrology to deliver high yields.

現在の掲載品

0

サービス

検査、保証、鑑定、ロジスティクス

トップ掲載リスト

    製品が見つかりません
このような製品をお持ちですか?
Moovに掲載品して、すぐに申し分ない購入者を見つけましょう。