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ACCRETECH / TSK UF3000
    説明
    Asset HSS: Not Available. Tool is operating in a clean room. Hard disk drive will be removed from tool.
    構成
    Overall accuracy : within 4µm Stage positioning accuracy: 2µm / cp300mm Low noise chuck Mini-Environment *Option Connected with an Agilent 4073A Tester. Temperature range: 15°C"-'150°C Configured for AmbienVHot temperatures. To operate up to 150°C. No Chiller equipped. Chuck Type: Low Noise Chuck. Chuck MFG: NOV-13 Tester Interface: Connected on GP-IB between Prober and Tester. Tool corresponds with Tester on GP-IB. Camera: Cognex Insight 17 42. No missing or damaged parts.
    OEMモデルの説明
    The UF3000 is a fully automatic, ultra-high function probing machine developed by ACCRETECH / TSK to be the de facto standard model for the semiconductor testing process. It meets a wide range of customer requirements, including high-mix low-volume production for System LSI and mass production for memories. The machine has received high evaluation from major device manufacturers in terms of CoO (Cost of Ownership) and OEE (Overall Equipment Efficiency).
    ドキュメント

    ドキュメントなし

    ACCRETECH / TSK

    UF3000

    verified-listing-icon

    検証済み

    カテゴリ

    Probers
    最終検証: 60日以上前
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    27520


    ウェーハサイズ:

    12"/300mm


    ヴィンテージ:

    2013

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    ACCRETECH / TSK UF3000
    ACCRETECH / TSKUF3000Probers
    ヴィンテージ: 0状態: 中古
    最終確認16日前

    ACCRETECH / TSK

    UF3000

    verified-listing-icon

    検証済み

    カテゴリ

    Probers
    最終検証: 60日以上前
    listing-photo-1cefe95bcbf64a73ac4270bfb08c5dff-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/42468/1cefe95bcbf64a73ac4270bfb08c5dff/9f28b80b06584dcb9b8641697cd065f1_e86e2cb7abf146c6b181170cf9eb9eaf1201a_f.jpeg
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    listing-photo-1cefe95bcbf64a73ac4270bfb08c5dff-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/42468/1cefe95bcbf64a73ac4270bfb08c5dff/7722d6dfa180475b95a89209fc1cdc64_47b07e74c14d489286d1210e21e195f6_f.jpeg
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    listing-photo-1cefe95bcbf64a73ac4270bfb08c5dff-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/42468/1cefe95bcbf64a73ac4270bfb08c5dff/c54f3b926594443f9b19cdcab55339f4_7563798a858a48d7a20501cd0aa3ec5a_f.jpeg
    listing-photo-1cefe95bcbf64a73ac4270bfb08c5dff-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/42468/1cefe95bcbf64a73ac4270bfb08c5dff/d286889a6b02493f81c90231f2565f4c_e80818a021454e6995223dc4bfe6b5d81201a_f.jpeg
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    27520


    ウェーハサイズ:

    12"/300mm


    ヴィンテージ:

    2013


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    Asset HSS: Not Available. Tool is operating in a clean room. Hard disk drive will be removed from tool.
    構成
    Overall accuracy : within 4µm Stage positioning accuracy: 2µm / cp300mm Low noise chuck Mini-Environment *Option Connected with an Agilent 4073A Tester. Temperature range: 15°C"-'150°C Configured for AmbienVHot temperatures. To operate up to 150°C. No Chiller equipped. Chuck Type: Low Noise Chuck. Chuck MFG: NOV-13 Tester Interface: Connected on GP-IB between Prober and Tester. Tool corresponds with Tester on GP-IB. Camera: Cognex Insight 17 42. No missing or damaged parts.
    OEMモデルの説明
    The UF3000 is a fully automatic, ultra-high function probing machine developed by ACCRETECH / TSK to be the de facto standard model for the semiconductor testing process. It meets a wide range of customer requirements, including high-mix low-volume production for System LSI and mass production for memories. The machine has received high evaluation from major device manufacturers in terms of CoO (Cost of Ownership) and OEE (Overall Equipment Efficiency).
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
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