説明
説明なし構成
OCR: Yes Wafer specification Size: 8"/12" Thickness: 240~750um Wafer size: 200mm~300mm Autoloader unit 300 mm FOUP/ FOSB and 200 mm cassette Single port Loader Interface GPIB Chuck Nickel plate Planarity : 15um (20℃≦t ≦50℃) 30um (50℃≦t ≦200℃) Temperature : 25℃ to 150℃ Withstand Load : 200kgf Display Unit: 15” color display & touch panel Cleaning Unit (100 mm x 60mm) 3 block with vacuum type APC function No Miscellaneous 1. Touch sensor. 2. Ethernet interface. 3. Cognex 8200 Docking interface VLCT Auto hinge No Probe card holder No Touch sensor YesOEMモデルの説明
The UF3000 is a fully automatic, ultra-high function probing machine developed by ACCRETECH / TSK to be the de facto standard model for the semiconductor testing process. It meets a wide range of customer requirements, including high-mix low-volume production for System LSI and mass production for memories. The machine has received high evaluation from major device manufacturers in terms of CoO (Cost of Ownership) and OEE (Overall Equipment Efficiency).ドキュメント
ドキュメントなし
カテゴリ
Probers
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
131882
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示
ACCRETECH / TSK
UF3000
カテゴリ
Probers
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
131882
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
説明なし構成
OCR: Yes Wafer specification Size: 8"/12" Thickness: 240~750um Wafer size: 200mm~300mm Autoloader unit 300 mm FOUP/ FOSB and 200 mm cassette Single port Loader Interface GPIB Chuck Nickel plate Planarity : 15um (20℃≦t ≦50℃) 30um (50℃≦t ≦200℃) Temperature : 25℃ to 150℃ Withstand Load : 200kgf Display Unit: 15” color display & touch panel Cleaning Unit (100 mm x 60mm) 3 block with vacuum type APC function No Miscellaneous 1. Touch sensor. 2. Ethernet interface. 3. Cognex 8200 Docking interface VLCT Auto hinge No Probe card holder No Touch sensor YesOEMモデルの説明
The UF3000 is a fully automatic, ultra-high function probing machine developed by ACCRETECH / TSK to be the de facto standard model for the semiconductor testing process. It meets a wide range of customer requirements, including high-mix low-volume production for System LSI and mass production for memories. The machine has received high evaluation from major device manufacturers in terms of CoO (Cost of Ownership) and OEE (Overall Equipment Efficiency).ドキュメント
ドキュメントなし