説明
System 1: missing PC unit System 2: missing power pack構成
X, Y Overall Accuracy:±2.0μm (Temp Stability ±1C) X, Y Stage Accuracy:±1.0μm Z-Axis Stroke(Applicable stroke):37mm Z-Axis Control Accuracy:±2μm Stage Durability:200kgf Hot chuck Temp. Range:50C to 150C This tool was docked with a JEC P2000A tester. INCLUDING A HINGE UNIT (MHF4000).OEMモデルの説明
The UF3000 is a fully automatic, ultra-high function probing machine developed by ACCRETECH / TSK to be the de facto standard model for the semiconductor testing process. It meets a wide range of customer requirements, including high-mix low-volume production for System LSI and mass production for memories. The machine has received high evaluation from major device manufacturers in terms of CoO (Cost of Ownership) and OEE (Overall Equipment Efficiency).ドキュメント
ドキュメントなし
ACCRETECH / TSK
UF3000
検証済み
カテゴリ
Probers
主なアイテムの詳細
状態:
Used
稼働ステータス:
不明
製品ID:
19573
ウェーハサイズ:
12"/300mm
ヴィンテージ:
2006
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Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示ACCRETECH / TSK
UF3000
検証済み
カテゴリ
Probers
最終検証: 60日以上前
主なアイテムの詳細
状態:
Used
稼働ステータス:
不明
製品ID:
19573
ウェーハサイズ:
12"/300mm
ヴィンテージ:
2006
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
System 1: missing PC unit System 2: missing power pack構成
X, Y Overall Accuracy:±2.0μm (Temp Stability ±1C) X, Y Stage Accuracy:±1.0μm Z-Axis Stroke(Applicable stroke):37mm Z-Axis Control Accuracy:±2μm Stage Durability:200kgf Hot chuck Temp. Range:50C to 150C This tool was docked with a JEC P2000A tester. INCLUDING A HINGE UNIT (MHF4000).OEMモデルの説明
The UF3000 is a fully automatic, ultra-high function probing machine developed by ACCRETECH / TSK to be the de facto standard model for the semiconductor testing process. It meets a wide range of customer requirements, including high-mix low-volume production for System LSI and mass production for memories. The machine has received high evaluation from major device manufacturers in terms of CoO (Cost of Ownership) and OEE (Overall Equipment Efficiency).ドキュメント
ドキュメントなし