説明
8” wafer handling system Hot chuck Z-stage Dual camera alignment system (DPS) EG Commander control PC Tester interface (GPIB/RS232/TTL).構成
構成なしOEMモデルの説明
This product line is positioned to satisfy high volume semiconductor manufacturing applications. The Horizon 4000 Series provides many advanced automation capabilities including automatic probe-to-pad-alignment, in-process inspection and optical character recognition (OCR). Optional for Horizon Series probers is a temperature controlled chuck top, providing the ability to maintain precisely a customer-selected wafer temperature during testing. The Horizon 4090, and Horizon 4090u micro utilize the Company's EGCommander system software. The 4090u prober also offers an integrated mini-environment and clean air system to provide a class 1 probing environment.ドキュメント
ドキュメントなし
カテゴリ
Probers
最終検証： 7日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
146740
ウェーハサイズ：
8"/200mm
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示
MARTEK / ELECTROGLAS (EG)
HORIZON 4090µ
カテゴリ
Probers
最終検証： 7日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
146740
ウェーハサイズ：
8"/200mm
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
8” wafer handling system Hot chuck Z-stage Dual camera alignment system (DPS) EG Commander control PC Tester interface (GPIB/RS232/TTL).構成
構成なしOEMモデルの説明
This product line is positioned to satisfy high volume semiconductor manufacturing applications. The Horizon 4000 Series provides many advanced automation capabilities including automatic probe-to-pad-alignment, in-process inspection and optical character recognition (OCR). Optional for Horizon Series probers is a temperature controlled chuck top, providing the ability to maintain precisely a customer-selected wafer temperature during testing. The Horizon 4090, and Horizon 4090u micro utilize the Company's EGCommander system software. The 4090u prober also offers an integrated mini-environment and clean air system to provide a class 1 probing environment.ドキュメント
ドキュメントなし