説明
The Ambios Technology, Inc. XP Stylus Profiler is a computerized, high-sensitivity surface profiler that measures roughness, waviness, and step height in a variety of applications. It features the ability to measure precision step heights from under 10 angstroms to as large as 100 microns (400μm with the extended sensor option), the XP profiler provides more than five orders of magnitude of precision Z height measurement. The XP profiler provides an affordable, high-resolution surface measurement capability that nicely complements other analytical instruments.構成
Ambios XP2 is a standard stylus profilometer for measuring step heights in the tens of nm up to 400 um. Step heights from 50A to 400um can be made using a computer controlled stylus profilometer. The stylus force can be adjusted so polymers samples such as photoresist can be measured. List of the current issues: -The stage squeaks badly -The USB communication fails periodically requiring software and/or hardware restart -Sometimes the stage won’t move during a scan for half the scan, then it will kick onOEMモデルの説明
提供なしドキュメント
ドキュメントなし
AMBIOS TECHNOLOGY, INC
XP-2
検証済み
カテゴリ
Profiler
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
53545
ウェーハサイズ：
不明
ヴィンテージ：
2006
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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AMBIOS TECHNOLOGY, INC
XP-2
検証済み
カテゴリ
Profiler
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
53545
ウェーハサイズ：
不明
ヴィンテージ：
2006
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
The Ambios Technology, Inc. XP Stylus Profiler is a computerized, high-sensitivity surface profiler that measures roughness, waviness, and step height in a variety of applications. It features the ability to measure precision step heights from under 10 angstroms to as large as 100 microns (400μm with the extended sensor option), the XP profiler provides more than five orders of magnitude of precision Z height measurement. The XP profiler provides an affordable, high-resolution surface measurement capability that nicely complements other analytical instruments.構成
Ambios XP2 is a standard stylus profilometer for measuring step heights in the tens of nm up to 400 um. Step heights from 50A to 400um can be made using a computer controlled stylus profilometer. The stylus force can be adjusted so polymers samples such as photoresist can be measured. List of the current issues: -The stage squeaks badly -The USB communication fails periodically requiring software and/or hardware restart -Sometimes the stage won’t move during a scan for half the scan, then it will kick onOEMモデルの説明
提供なしドキュメント
ドキュメントなし
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すべて表示同様のリストが見つかりません