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KLA RS75
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    The OmniMap RS75 is a four-point probe series that offers precise sheet resistance measurements for monitor wafers. It is faster than existing systems and is suitable for a variety of semiconductor process monitoring applications, including ion implantation, metal deposition, CMP, diffusion, polysilicon, epi, RTP, and bulk silicon. The system can process over 100 wafers per hour when conducting a five-site test on 200 mm wafers, with temperature compensation and flat alignment. A 49-site contour map with temperature compensation can be completed on a manually loaded test wafer in less than sixty seconds. This makes the OmniMap RS75 a production-worthy tool for sheet resistance mapping.
    ドキュメント

    ドキュメントなし

    KLA

    RS75

    verified-listing-icon

    検証済み

    カテゴリ
    Resistivity / Four Point Probe

    最終検証: 30日以上前

    主なアイテムの詳細

    状態:

    Refurbished


    稼働ステータス:

    不明


    製品ID:

    115314


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    KLA RS75

    KLA

    RS75

    Resistivity / Four Point Probe
    ヴィンテージ: 0状態: 改修済み
    最終確認30日以上前

    KLA

    RS75

    verified-listing-icon
    検証済み
    カテゴリ
    Resistivity / Four Point Probe
    最終検証: 30日以上前
    listing-photo-0e7c0a109d9048fc95d82061518a74ac-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/46062/0e7c0a109d9048fc95d82061518a74ac/f2a983940adf42f2909b2930886a74b3_img0602_mw.jpg
    listing-photo-0e7c0a109d9048fc95d82061518a74ac-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/46062/0e7c0a109d9048fc95d82061518a74ac/29dcd5a533d44c76aab7179f4d103ef8_img0596_mw.jpg
    listing-photo-0e7c0a109d9048fc95d82061518a74ac-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/46062/0e7c0a109d9048fc95d82061518a74ac/a61971bd640a4f0b80b757e47ad63db6_img0601_mw.jpg
    listing-photo-0e7c0a109d9048fc95d82061518a74ac-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/46062/0e7c0a109d9048fc95d82061518a74ac/d5159b4be0ac4c2da53b8be779608fdc_img0594_mw.jpg
    listing-photo-0e7c0a109d9048fc95d82061518a74ac-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/46062/0e7c0a109d9048fc95d82061518a74ac/e7af9df8a3574f869d6e7e3f1fa397ed_img0597_mw.jpg
    listing-photo-0e7c0a109d9048fc95d82061518a74ac-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/46062/0e7c0a109d9048fc95d82061518a74ac/35547753a39041a38ed50afa348a0970_img0598_mw.jpg
    listing-photo-0e7c0a109d9048fc95d82061518a74ac-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/46062/0e7c0a109d9048fc95d82061518a74ac/2000781c16e64bf8a7541e7b684cc2da_img0599_mw.jpg
    listing-photo-0e7c0a109d9048fc95d82061518a74ac-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/46062/0e7c0a109d9048fc95d82061518a74ac/ecbbdbdcf4e0406b88ce18bf49682edc_img0595_mw.jpg
    主なアイテムの詳細

    状態:

    Refurbished


    稼働ステータス:

    不明


    製品ID:

    115314


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    The OmniMap RS75 is a four-point probe series that offers precise sheet resistance measurements for monitor wafers. It is faster than existing systems and is suitable for a variety of semiconductor process monitoring applications, including ion implantation, metal deposition, CMP, diffusion, polysilicon, epi, RTP, and bulk silicon. The system can process over 100 wafers per hour when conducting a five-site test on 200 mm wafers, with temperature compensation and flat alignment. A 49-site contour map with temperature compensation can be completed on a manually loaded test wafer in less than sixty seconds. This makes the OmniMap RS75 a production-worthy tool for sheet resistance mapping.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    KLA RS75

    KLA

    RS75

    Resistivity / Four Point Probeヴィンテージ: 0状態: 改修済み最終検証:30日以上前
    KLA RS75

    KLA

    RS75

    Resistivity / Four Point Probeヴィンテージ: 0状態: 中古最終検証:8日前
    KLA RS75

    KLA

    RS75

    Resistivity / Four Point Probeヴィンテージ: 0状態: 中古最終検証:30日以上前