KLA inhabits two worlds: one that’s nanometers in scale and one that’s global. This micro and macro view gives us a unique perspective. We see electrons wave and industries transform. When you put deep science together with optimism, big things happen.

Our process-control and process-enabling solutions are designed to boost the innovation speed of the electronics industry. We help our customers achieve leading-edge performance.

The OmniMap® RS75 series is a tool designed to help semiconductor manufacturers perform accurate wafer characterization and critical production monitoring at substantially greater speeds. It addresses a wide variety of process applications where film thickness and sheet resistance are critical. The RS75/tc model incorporates a patented temperature compensation (tc) solution, allowing the system to correct for temperature variations, dramatically affecting long-term repeatability, accuracy, and system-to-system matching. The RS75 series is offered in a variety of configurations to meet customer production requirements, including automated and manual versions, both of which are available with or without temperature compensation. Models include the Auto RS75/tc, RS75/tc, Auto RS75, and the RS75.

KLA

OmniMap RS75/TCA

Resistivity / Four Point Probe

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OmniMap RS75/TCA

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OmniMap RS75/TCA

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OmniMap RS75/TCA

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OmniMap RS75/TCA

KLA

OmniMap RS75/TCA

KLA

OmniMap RS75/TCA

KLA

OmniMap RS75/TCA

KLA

OmniMap RS75/TCA

OmniMap RS75/TCA

Resistivity / Four Point Probe

同様のリスト

KLA

OmniMap RS75/TCA

KLA

OmniMap RS75/TCA

KLA

OmniMap RS75/TCA

KLA

OmniMap RS75/TCA

KLA

OmniMap RS75/TCA

KLA

OmniMap RS75/TCA

KLA

OmniMap RS75/TCA

KLA

OmniMap RS75/TCA