ALTURA 855
カテゴリ
SEM / FIB概要(Overview)
FEl's Altura- 855 offers the ultimate tools for defect characterization, failure analysis, and TEM sample preparation on patterned and unpatterned wafers, as well as piece parts.
現在の掲載品
1
サービス
検査、保証、鑑定、ロジスティクス
FEl's Altura- 855 offers the ultimate tools for defect characterization, failure analysis, and TEM sample preparation on patterned and unpatterned wafers, as well as piece parts.
1
検査、保証、鑑定、ロジスティクス