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EXPIDA 1255
カテゴリ
SEM / FIB概要（Overview）
Expida 1255 wafer DualBeam system, FEI: Ultra-High-Resolution Analysis - Following the success of its Expida 1255 wafer DualBeam system for semiconductor labs, FEI Company has introduced the next-generation tool in the product family, the Expida 1255S.
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検査、保証、鑑定、ロジスティクス
