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市場 > SEM / FIB > HITACHI > SU7000

SU7000

カテゴリ
SEM / FIB
概要(Overview)

The modern FE-SEM requires not only high performance but also a multitude of functionalities including wide-area observation, in-situ analysis, variable pressure, high-resolution imaging at low accelerating voltages, and simultaneous multi-signal collection. The SU7000 is designed to address these aspects and more by delivering enhanced information for diversified needs in the field of electron microscopy.

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