SU8220
カテゴリ
SEM / FIB概要（Overview）
The SU8200 opens a new gateway for SEM analysis. The ultimate SEM electron source now offers high signal to noise )S/N0 and uncompromising resolutions with beam current and stability, which is critical for analytical solutions. The robust SU8200 series supports a wide variety of applications within material research ‘ development and industrial quality control environments
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