説明
– It is a FE SEM with Ga FIB column, airlock, Kliendiek MM3 micro-manipulator, and multi-chemistry gas-injection system (currently it runs C and W for depositions, though it has capacity for others in non-heated precursor chambers). – It is also set up with a Leica VCT100 cryo-stage, though the interlock is currently not functional (can still be used for cryo during milling, but requires samples to be loaded and unloaded at room temperature and in atmosphere). – Oxford EDS system構成
構成なしOEMモデルの説明
The NVision 40 operates with two beams, one electron beam and one ion beam. Both beams can be used independently of each other to generate images using the secondary electrons emitted from the surface of the specimen. The ion beam can be used for imaging in addition material removal or coating purposes.ドキュメント
ドキュメントなし
ZEISS / CARL ZEISS
NVision 40
検証済み
カテゴリ
SEM
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
50917
ウェーハサイズ：
不明
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示同様のリストが見つかりません
ZEISS / CARL ZEISS
NVision 40
検証済み
カテゴリ
SEM
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
50917
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
– It is a FE SEM with Ga FIB column, airlock, Kliendiek MM3 micro-manipulator, and multi-chemistry gas-injection system (currently it runs C and W for depositions, though it has capacity for others in non-heated precursor chambers). – It is also set up with a Leica VCT100 cryo-stage, though the interlock is currently not functional (can still be used for cryo during milling, but requires samples to be loaded and unloaded at room temperature and in atmosphere). – Oxford EDS system構成
構成なしOEMモデルの説明
The NVision 40 operates with two beams, one electron beam and one ion beam. Both beams can be used independently of each other to generate images using the secondary electrons emitted from the surface of the specimen. The ion beam can be used for imaging in addition material removal or coating purposes.ドキュメント
ドキュメントなし
同様のリスト
すべて表示同様のリストが見つかりません