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THERMOFISHER SCIENTIFIC / FEI / PHILLIPS NOVA NANOSEM 230
    説明
    説明なし
    構成
    FEI Nova Nano 230 FEG SEM - 3 Vacuum Modi - Manual Control Panel - Helix Detector - STEM Detector - Cryo pump
    OEMモデルの説明
    The Nova NanoSEM 230 is a scanning electron microscope that offers enhanced capabilities compared to its predecessor. It excels in low and very low kV characterization and has improved analytical capabilities. With the Nova NanoSEM 230, it is possible to access sub-100V imaging with high surface sensitivity, achieve superb low kV BSE, and perform faster analysis. In summary, the Nova NanoSEM 230 is a powerful tool for low kV characterization and analysis.
    ドキュメント

    ドキュメントなし

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    NOVA NANOSEM 230

    verified-listing-icon

    検証済み

    カテゴリ
    SEM

    最終検証: 60日以上前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    83650


    ウェーハサイズ:

    不明


    ヴィンテージ:

    2009

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
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    同様のリスト
    すべて表示
    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS NOVA NANOSEM 230

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    NOVA NANOSEM 230

    SEM
    ヴィンテージ: 0状態: 中古
    最終確認5日前

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    NOVA NANOSEM 230

    verified-listing-icon
    検証済み
    カテゴリ
    SEM
    最終検証: 60日以上前
    listing-photo-32890478d43e4cd5a83ca1b82cd54b64-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    83650


    ウェーハサイズ:

    不明


    ヴィンテージ:

    2009


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    説明なし
    構成
    FEI Nova Nano 230 FEG SEM - 3 Vacuum Modi - Manual Control Panel - Helix Detector - STEM Detector - Cryo pump
    OEMモデルの説明
    The Nova NanoSEM 230 is a scanning electron microscope that offers enhanced capabilities compared to its predecessor. It excels in low and very low kV characterization and has improved analytical capabilities. With the Nova NanoSEM 230, it is possible to access sub-100V imaging with high surface sensitivity, achieve superb low kV BSE, and perform faster analysis. In summary, the Nova NanoSEM 230 is a powerful tool for low kV characterization and analysis.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS NOVA NANOSEM 230

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    NOVA NANOSEM 230

    SEMヴィンテージ: 0状態: 中古最終検証: 5日前
    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS NOVA NANOSEM 230

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    NOVA NANOSEM 230

    SEMヴィンテージ: 2009状態: 中古最終検証: 60日以上前