説明
De-installed last week and crated.構成
Specification: Secondary electron image resolution: 2.1nm at 1kV 1.5nm at 15kV and WD = 12mm or X-ray analysis position Magnification: LM mode: 20 ~ 2,000X HM mode: 100 ~ 800,000X Specimen Stage: Type I: X: 0 ~ 25mm; Y: 0 ~ 25mm, Z: 1.5 ~ 26.5mm; T: -5 ~ +45 deg, R: 360 deg. 100 loadlock 2 axis motorization, mouse control Operating System: Windows XP Vacuum: Turbo Pump Water Chiller: Haskris water cooled Misc: Manuals and backup software discs Packing List: S-4700 pack -1 column -1 display -1 chiller -1 transformer -2 ulvac pumps -1 tmp controller -1 AC power supply -1 weight -1 box with PC, monitor and stand, keyboard, vac hose, RP weight pipes, BSE detector box -1 box misc accessories – software, bake inner/outer, sample holders, misc parts, mouse chamberscope lcd,base, and power supply -1 Oxford PC -1 oxford Monitor -1 Oxford misc box of cables and controllers -1 LN2 oxford detectorOEMモデルの説明
The S-4700 Type I is a cutting-edge electron microscope with remarkable features. It offers high-resolution imaging at low accelerating voltages, ensuring a guaranteed resolution of 2.1 nm at 1 kV. Routine microscopy is made convenient with a long working distance of 12 mm, allowing sample exchange via an airlock without the need for repositioning. At 15 kV, the microscope maintains a high resolution of 1.5 nm. Additionally, it enables a sample tilt of 45 degrees without altering the working distance and offers a high X-ray take-off angle of 30 degrees with the sample normal to the beam. The instrument boasts an integrated electron detector for both secondary electrons (SE) and backscattered electrons (BSE), allowing operators to choose the best imaging mode for their samples. With complete column setup controlled through a computer interface, users can effortlessly switch between ultra-high-resolution mode and analysis mode. The unique objective lens design permits simultaneous use of YAG-type BSE and EDX detectors, enhancing imaging versatility.ドキュメント
ドキュメントなし
HITACHI
S-4700 I
検証済み
カテゴリ
SEM
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
49171
ウェーハサイズ：
不明
ヴィンテージ：
不明
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Logistics Support
Available
Money Back Guarantee
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すべて表示
HITACHI
S-4700 I
検証済み
カテゴリ
SEM
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
49171
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
De-installed last week and crated.構成
Specification: Secondary electron image resolution: 2.1nm at 1kV 1.5nm at 15kV and WD = 12mm or X-ray analysis position Magnification: LM mode: 20 ~ 2,000X HM mode: 100 ~ 800,000X Specimen Stage: Type I: X: 0 ~ 25mm; Y: 0 ~ 25mm, Z: 1.5 ~ 26.5mm; T: -5 ~ +45 deg, R: 360 deg. 100 loadlock 2 axis motorization, mouse control Operating System: Windows XP Vacuum: Turbo Pump Water Chiller: Haskris water cooled Misc: Manuals and backup software discs Packing List: S-4700 pack -1 column -1 display -1 chiller -1 transformer -2 ulvac pumps -1 tmp controller -1 AC power supply -1 weight -1 box with PC, monitor and stand, keyboard, vac hose, RP weight pipes, BSE detector box -1 box misc accessories – software, bake inner/outer, sample holders, misc parts, mouse chamberscope lcd,base, and power supply -1 Oxford PC -1 oxford Monitor -1 Oxford misc box of cables and controllers -1 LN2 oxford detectorOEMモデルの説明
The S-4700 Type I is a cutting-edge electron microscope with remarkable features. It offers high-resolution imaging at low accelerating voltages, ensuring a guaranteed resolution of 2.1 nm at 1 kV. Routine microscopy is made convenient with a long working distance of 12 mm, allowing sample exchange via an airlock without the need for repositioning. At 15 kV, the microscope maintains a high resolution of 1.5 nm. Additionally, it enables a sample tilt of 45 degrees without altering the working distance and offers a high X-ray take-off angle of 30 degrees with the sample normal to the beam. The instrument boasts an integrated electron detector for both secondary electrons (SE) and backscattered electrons (BSE), allowing operators to choose the best imaging mode for their samples. With complete column setup controlled through a computer interface, users can effortlessly switch between ultra-high-resolution mode and analysis mode. The unique objective lens design permits simultaneous use of YAG-type BSE and EDX detectors, enhancing imaging versatility.ドキュメント
ドキュメントなし