Thermo Fisher Scientific Inc. (NYSE: TMO), the world leader in serving science, today announced that it has completed its acquisition of FEI Company, Inc. (NASDAQ: FEIC), the leader in high-performance electron microscopy. FEI and Philips joined their technologies in 1993 to create the first DualBeam (FIB/SEM) workstation.

The ExSolve 2 WTP saves over 25% on TEM sample prep capital expense for leading electronics manufactures with a proprietary fast milling process and automation.

THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

EXSOLVE 2 WTP

The FEI Tecnai™ G2 F20 is a 200 kV scanning transmission electron microscope (S/TEM) that offers high performance, versatility, and productivity. It has a task-oriented user interface that runs on the Windows® XP operating system and is designed to be easy to use. The microscope can be fitted with various accessories such as STEM, CCD cameras, EDX and EELS detectors, and energy filters, which are all integrated into the user interface. This allows operators of different experience levels to fully utilize the functionality of the system through one coherent interface.

TECNAI G2 F20

The Helios NanoLab 1200HP is a DualBeam system that can prepare ultra-thin samples with minimal damage in a short amount of time. It is equipped with iFast™ automation software, which makes it easy to use and ensures consistent results among multiple operators and systems. The system also features QuickFlip grid holders for improved sample quality and high throughput, as well as Cell Navigation software for automated navigation within non-unique memory arrays. These features enable the Helios NanoLab 1200HP to prepare high-quality, ultra-thin lamella in a consistent manner, regardless of operator skill level.

HELIOS NANOLAB 1200HP

TECNAI 20

CM20

TECNAI G2 F20 X-TWIN

CM200

The Tecnal"' G2 F30 series are re11able and proven (scanning) transmission electron microscopes, with a unique and unrivalled task-orie-nted user Interface. The accessories that may be fitted to these systems have largely been embedded Into this user Interface, meaning that operators can utilize the full functionality of the total microscope system through one coherent Interface, allowing all the capabilities of the system to be easily controlled by operators of different experience levels.

TECNAI G2 F30

CM 100

TECNAI G2 F30 S-TWIN

The Thermo Scientific Helios NanoLab 1200AT DualBeam can create site-specific transmission electron microscope (TEM) samples thin enough to capture a single transistor at the 10nm node, from wafers up to 300mm in diameter. An optional Automated FOUP Loader (AFL) allows the system to be located inside the semiconductor wafer fab, where it can deliver critical information up to three times faster than laboratory-based analysis.

HELIOS NANOLAB 1200AT 

CM10

Philips 1972 model EM 301 TEM was designed for high performance and versatility for the skilled operator who had the time to coax the best results from his instrument. 

EM-301

The EM 400 introduced in 1975 used a LAB6 electron gun, which was ten times as bright as the standard tungsten filament at the time. On the down side, the reactivity of lanthanum hexaboride required an ultra-clean vacuum system of 10-6 Torr.

EM-400

Philips 1970 model EM 201 was one of the simplified, easy-to-use TEMs on the market. The gun alignment was more automated, and the microscope stayed in focus despite changes in voltage and magnification.

EM-201

The FEI Tecnai TF-30 is a 300KV Transmission Electron Microscope (TEM) that is designed for the analysis of both hard and soft materials. It is capable of performing cryotomography on biological specimens, as well as TEM and tomography on hard materials. The system is equipped with high angle tomography, double-tilt and cryo holders, and can perform energy filtered TEM (EFTEM) and high angle annular dark field (HAADF) analysis. Additionally, the TF-30 features a Gatan K2 direct electron detector, which significantly improves contrast and resolution for both large and small molecules in cryo-electron microscopy.

TECNAI TF-30

TECNAI G2 F20 S-TWIN

TECNAI 10

TECNAI G2 F30 TWIN

TECNAI G2 F20 U-TWIN

advanced analytical scanning/transmission electron microscope

THEMIS Z

MORGAGNI

TECNAI G2 F30 U-TWIN

CM120 BioTwin

CM120

CM200 FEG microscope offers a unique combination of ultra high-resolution capabilities in TEM imaging, in scanning-imaging and in micro-analysis.

CM200-FEG

CM 12

TECNAI G2 F20 TWIN

EM-208

The image-corrected Titan G2 60-300 S/TEM provides superior performance, stability, and flexibility when utilizing the Cs image-corrector and electron monochromator technology for atomic resolution imaging and spectroscopy. The system provides flexibility of operating voltages at 60, 160 and 300 kV. Additionally, with the relatively wide pole piece gap of the S-TWIN lens, the Titan G2 60-300 is designed for dynamic experiments, with space around the sample area. 

THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

概要（Overview）

現在の掲載品

全ての製品

サービス

トップTHERMOFISHER SCIENTIFIC / FEI / PHILLIPS TEM

HELIOS NANOLAB 1200HP

EXSOLVE 2 WTP

TECNAI G2 F20

TECNAI 20

Moovに掲載品して、すぐに申し分ない購入者を見つけましょう。

すべてのTHERMOFISHER SCIENTIFIC / FEI / PHILLIPS TEM