AFS-300
概要（Overview）
The AFS-300 series systems operate in a class 10 cleanroom, utilizing ADE's E-Plus station for precision. They measure wafer properties with high accuracy (0.25 microns), including thickness, flatness, shape, conductivity, and resistivity. Integration with factory automation is seamless through standard protocols.
現在の掲載品
0
サービス
検査、保証、鑑定、ロジスティクス
トップ掲載リスト
- 製品が見つかりません