NanoSpec AFT 210 VT
概要(Overview)
The Nanometrics NanoSpec AFT 210 VT is a computerized, optical non-contact thin-film thickness measurement system used primarily in semiconductor manufacturing and cleanrooms.
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検査、保証、鑑定、ロジスティクス
The Nanometrics NanoSpec AFT 210 VT is a computerized, optical non-contact thin-film thickness measurement system used primarily in semiconductor manufacturing and cleanrooms.
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検査、保証、鑑定、ロジスティクス