MetaPULSE-III 300
概要（Overview）
MetaPULSE-III 300 is designed specifically to meet semiconductor manufacturers' metal thin-film metrology requirements at the 45 nm technology node and beyond. The modular design of the MetaPULSE-III offers Rudolph's patented PULSE Technology.
現在の掲載品
3
サービス
検査、保証、鑑定、ロジスティクス
