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PM62
カテゴリ
Wafer Handling概要（Overview）
An ambient and elevated temperature test handler designed to test Power Devices. Test Options include Electrical Functional Test, Open Short Test and Ambient/ Hot Test which ranges from room temperature to +25°C to 155°C. The handler also comes with features such as Smart Temperature Control, User Definable Soak Time and Auto Calculation of Offset Temperature Value.
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