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6" Fab For Sale from Moov - Click Here to Learn More
6" Fab For Sale from Moov - Click Here to Learn More
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6" Fab For Sale from Moov - Click Here to Learn More
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FISCHERSCOPE XDVM-T7.1-W
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    The FISCHERSCOPE® X-RAY XDV®-μ instruments are Fischer's high-end X-ray fluorescence series. They offer precise coating thickness measurement and material analysis on tiny structures. Equipped with powerful silicon drift detectors and polycapillary optics, they ensure quick and repeatable measurements with high radiation intensity. These instruments find applications in the electronics and semiconductor industry for measuring small structures like bond surfaces, SMD components, and thin wires. The XDV®-μ instruments feature a long-distance capillary for precise measurements on assembled PCBs and connectors. With a spacious measuring chamber, advanced polycapillary optics, and fast DPP+ digital pulse processor, they deliver accurate and efficient results.
    ドキュメント

    ドキュメントなし

    FISCHERSCOPE

    XDVM-T7.1-W

    verified-listing-icon

    検証済み

    カテゴリ
    X-Ray / XRD / XRF

    最終検証: 60日以上前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    84342


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    FISCHERSCOPE XDVM-T7.1-W

    FISCHERSCOPE

    XDVM-T7.1-W

    X-Ray / XRD / XRF
    ヴィンテージ: 0状態: 中古
    最終確認60日以上前

    FISCHERSCOPE

    XDVM-T7.1-W

    verified-listing-icon
    検証済み
    カテゴリ
    X-Ray / XRD / XRF
    最終検証: 60日以上前
    listing-photo-7d6b7d80c35f400aa5f88e29f24b0f0f-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    84342


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    The FISCHERSCOPE® X-RAY XDV®-μ instruments are Fischer's high-end X-ray fluorescence series. They offer precise coating thickness measurement and material analysis on tiny structures. Equipped with powerful silicon drift detectors and polycapillary optics, they ensure quick and repeatable measurements with high radiation intensity. These instruments find applications in the electronics and semiconductor industry for measuring small structures like bond surfaces, SMD components, and thin wires. The XDV®-μ instruments feature a long-distance capillary for precise measurements on assembled PCBs and connectors. With a spacious measuring chamber, advanced polycapillary optics, and fast DPP+ digital pulse processor, they deliver accurate and efficient results.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    FISCHERSCOPE XDVM-T7.1-W

    FISCHERSCOPE

    XDVM-T7.1-W

    X-Ray / XRD / XRFヴィンテージ: 0状態: 中古最終検証:60日以上前