説明
Dimension X3D - Model 340 Atomic Force Microscope (AFM)構成
構成なしOEMモデルの説明
The Dimension X3D is an Automated Atomic Force Microscope that provides nondestructive, gauge-capable, automated metrology with three-dimensional (X, Y, and Z) in-line characterization of critical dimension (CD) feature shape control. It is designed for critical level control in leading-edge device manufacturing and can gather detailed data on crucial CD elements. The X3D can scan on any material and its AFM technology enables unmatched resolution and repeatability.ドキュメント
ドキュメントなし
BRUKER
DIMENSION X3D
検証済み
カテゴリ
AFM
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
89487
ウェーハサイズ：
不明
ヴィンテージ：
2005
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
BRUKER
DIMENSION X3D
カテゴリ
AFM
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
89487
ウェーハサイズ：
不明
ヴィンテージ：
2005
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Dimension X3D - Model 340 Atomic Force Microscope (AFM)構成
構成なしOEMモデルの説明
The Dimension X3D is an Automated Atomic Force Microscope that provides nondestructive, gauge-capable, automated metrology with three-dimensional (X, Y, and Z) in-line characterization of critical dimension (CD) feature shape control. It is designed for critical level control in leading-edge device manufacturing and can gather detailed data on crucial CD elements. The X3D can scan on any material and its AFM technology enables unmatched resolution and repeatability.ドキュメント
ドキュメントなし