OLYMPUS

SZ61

The Olympus MX50 is a microscope designed for inspecting semiconductors and wafers. It is user-friendly and allows for comfortable operation during extended periods of use. The microscope offers a variety of observation methods, including brightfield, darkfield, differential interference contrast (DIC), and polarized light. Additionally, it has a motorized objective change feature for quick and easy observation changes

MX50

SZ40

MX50A-F

The STM6 series is a range of measuring microscopes from Olympus that offers more versatility and higher performance than ever before. The series features a wide range of models to meet various customer demands for new measuring capabilities and superior functionality. Some of the models in the range include the STM6-LM, which is designed for fast inspection of large samples, and the high-precision STM6, which has the most compact body in its class. The series also offers many optional units to ensure that every measurement need can be met. Some of the outstanding features of the STM6 series include motorized focusing, advanced UIS2 optics, a high-rigidity body with integrated counters, high-performance long-life LED illumination for bright and clear images, and much more. Overall, the STM6 series is a highly advanced and versatile range of measuring microscopes that offers exceptional levels of precision and durability.

STM6

The Olympus MX61L is a microscope designed for inspecting semiconductors with a 300mm frame. It offers high-quality imaging through various observation techniques, including brightfield, darkfield, differential interference contrast (DIC), fluorescence, infrared, and deep UV. This microscope is part of the Olympus Semiconductor & Flat Panel Display Inspection Solution and is an extended frame version of the MX61 microscope, capable of handling 300mm wafers and flat panels up to 24x24 inches.

MX61L

BH2-UMA

The Olympus MX61 is a 200 mm semiconductor inspection microscope that provides exceptional image resolution and clarity through observation methods such as brightfield, darkfield, differential interference contrast (DIC), fluorescence, infrared, and deep UV. It is part of the Olympus Semiconductor & Flat Panel Display Inspection Solution.

MX61

BX51

SZ51

BX51M

The Olympus LEXT OLS3000 is a confocal laser scanning microscope that was launched on January 26, 2004. It has the world’s highest resolution of 0.12µm, achieved by using a newly developed optical system optimized for a 408nm semiconductor laser. The microscope also allows for color 3D observations by integrating an optical system used for optical microscopes into the laser system

LEXT OLS3000

MX63

MX51

"Semiconductor wafer inspection microscope (up to 200 mm) enabling
fast, accurate inspection via motorized aperture stop interlocked with
objective lens. Ergonomic design delivers operator comfort. SEMI S2/S8
compliance ensures safety and reliability."

MX61-F

BHMJL

SZ30

SZ60

BX41M-LED

SZ3060

OLS31-SU

AL100-L8

BX40

AL110-LMB6

**PARTS**

AL110 + MX61

AL120-LMB12-LP3/MX61L

INSPB01

MX61L-F

AL100-LB6	

AL-1MBL

IX51

BH3-MJL

IX71

AL110-LMB12/MX50LR

AL-100-L6

KIF-201

BX6OMF

SZH-ILLK

BX60F5

With an LED illuminator equivalent to or better than a 100 W halogen lamp, the BX53 microscope delivers
outstanding brightness that's ideal for teaching and polarized light applications.

BX53

The Olympus AL110-LMB86 is an automated wafer loader designed for use with the MX61 microscope. It belongs to the AL110 series of programmable wafer handlers, which are known for their cost-effectiveness and versatility. These features make them an ideal choice when a programmable wafer handler is needed to increase throughput. The AL110 series offers a range of formats, as well as non-contact optical wafer centering and notch detection. It also boasts high-throughput and is class 10 compatible, with a stainless steel facade that makes it suitable for use in clean rooms. Additionally, it can be integrated with an MX50 or MX80 via a manual or motorized shuttle stage, allowing for automated wafer inspections.

AL110-LMB86

STM6-LM

IX70

AHMT3

CKX41SF

KIF-FSPC

AL120-LMB6-150

BX61	

BX41RF-LED

SZ1145TR

OLS4000

AL-110-12-LP

CK40

BXFMA

BH3-MJLA2

MX50T-F

OLS5000

BX51TRF

AL110-LMB12-LP2/MX61L-F	

IX70-S8F2

MX-40

U-AFA1M

MHL 525

AL100-LMB8

MX-50A 

AL2000

AL100-LM6

The Olympus AL120 is a semiconductor wafer handler with a microscope. It is designed to accommodate different wafer sizes, making it a key tool for expanding wafer fabrication facilities. The AL120 series consists of three models based on wafer diameter: the 200mm model, the 150mm and 200mm convertible model, and the 150mm model for wafer sizes of 150mm or less. Each system is designed for wafer transfer and microscope inspection, with topside and backside macro inspections available for all wafer sizes. The 360-degree self-rotating function provides a complete macro inspection of the wafer’s top and back surface, enabling easy identification of defects and particles

AL120

SZ4045

MX80F

AL3100

MX51F	

PME 3

Nortec 500

MX50L-RF

AL3120F-DUV

SZ61TR

MX63L

KIF-202

MX50A-873MD

SZH-ILLC-2

BH3-MJLA4-383D

The CKX41 is an inverted microscope suitable for regular cell observation including GFP and other fluorescence applications. The high-angle tilting head is ideal for simple visual checks, while advanced Universal Infinity System 2 (UIS2) optics produce outstanding images. Olympus relief contrast increases visibility with non-glass cell culture vessels and improves productivity with its pre-centered slider. Post-acquisition analysis, documentation, and archiving can be achieved with digital cameras and software.

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MX50A-F

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