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MX61-F
カテゴリ
Microscope概要（Overview）
"Semiconductor wafer inspection microscope (up to 200 mm) enabling fast, accurate inspection via motorized aperture stop interlocked with objective lens. Ergonomic design delivers operator comfort. SEMI S2/S8 compliance ensures safety and reliability."
現在の掲載品
7
サービス
検査、保証、鑑定、ロジスティクス
